1.The design of a high-performance, full-custom integrated circuit (IC) is, of course, a difficult task. In full-custom IC design, everything, down to and including individual transistors may be designed (although libraries of parts are, of course, used).

1.高性能，全定制集成电路（IC）的设计当然是一个困难的任务。在全定制集成电路的设计中，所有事情，甚至是单个晶体管都需要被设计（当然，尽管要用到一些库）。

2.For many years, however, it has been possible to build semi-custom integrated circuits using gate arrays. A gate array, as its name suggests, is an integrated circuit on which an array of gates has been created. The design of an application-specific integrated circuit (ASIC) using a gate array therefore involves the definition of how the gates in the array should be connected.

2.但是，多年以来，可以使用门阵列构建半导体集成电路。门阵列，正如其名，是由许多逻辑门所构建的集成电路。因此，使用门阵列进行专用集成电路的设计包括定义列阵中的逻辑门是如何连接的。

3.In practical terms, this means that one or two layers of metal interconnect must be designed. Since an integrated circuit requires seven or more processing stages, all the processing steps other than the final metalization can be completed in advance. Because the uncommitted gate arrays can be produced in volume, the cost of each device is relatively small.

3.在实际情况中，这意味着一到两层的金属互连必须被设计。由于集成电路需要七个或更多的加工过程，除了最终的金属化，其它步骤都可以预先完成。因为这些未知用途门列阵可以大量生产，每个器件的成本非常低。

4.A diode is reverse biased when the diode negative electrode voltage is higher than the anode electric potential. The diode internal resistance was extremely high by now.

4.当二极管的正极电压高于负极电位时称二极管反向偏置，这时二极管的内部电阻非常高，所以一个理想的二极管可以阻挡反向的电流而让正向的电流通过。

5.There are four basic tests required for transistors in practical applications: gain, leakage, breakdown, and switching time. All of these tests are best made with commercial testers or oscilloscopes.

5.在实际应用中，对晶体管须进行四项基本测试：增益、漏电流、击穿电压和开关时间。所有这些测试最好用通用晶体管测试仪和示波器进行测试。